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e-Journal Details
Title: Ieee design & Test
Abbrev: IEEE DES. TEST
Abbrev: IEEE DES TEST
Alternative: IEEE design and test
Alternative: Design and Test, IEEE
Alternative: Design & Test, IEEE
Alternative: IEEE Design and Test Magazine
ISSN: 2168-2356
LCCN: 2012200562
Peer-Reviewed: Yes
 
Availability: IEEE Electronic Library (IEL) Journals
 
Available from 2013 volume: 30 issue: 1
 
Journal History:
Continues: IEEE Design & Test of Computers [0740-7475]